The following sections cover the basic concepts and technologies that underpin the construction and operation of an atomic force microscope. An atomic force microscope is optimized for measuring ...

This article serves as a basic introduction to the design and operation of an atomic force microscope. The following sections cover the basic concepts and technologies that help understand the ...

“A standard atomic force microscope is a large, bulky instrument, with multiple control loops, electronics and amplifiers,” said Dr. Reza Moheimani, professor of mechanical engineering at UT Dallas.

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Atomic force microscopy (AFM) represents a better choice compared to light-based microscopy methods for the stufy of microtubules. For instance, the AFM can be used in buffers to image samples at a ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic Force Microscopy (AFM) is a type of high-resolution scanning probe microscopy that allows for imaging, manipulation, and force measurement. Atomic Force Microscopy was first developed in 1986 ...

The rapid emergence of Scanning Probe Microscopy (SPM) techniques in the last three decades opened a new chapter in nanoscale exploration and manipulation by thousands of research groups worldwide 1,2 ...

The NanoLens AFM provides excellent surface information with sub-nanometer height resolution and typically less than 10nm lateral resolution. These capabilities provide a significant extension of the ...

Doing it yourself may not get you the most precise lab equipment in the world, but it gets you a hands-on appreciation of the techniques that just can’t be beat. Today’s example of this adage: [Stoppi ...

The deep learning algorithm developed by researchers at the University of Illinois Urbana-Champaign is trained to remove the effects of the probe’s width from AFM microscope images. As reported in the ...