Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

A new electron spin resonance-atomic force microscopy setup enables single-spin quantum control on nonconductive samples.

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...

GWACHEON, South Korea, April 30, 2026 /PRNewswire/ -- Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) solutions, today announced the launch of the NX1 — a compact, ...

Oxford Instruments introduces the Jupiter Discovery Atomic Force Microscope (AFM) to deliver best-in-class performance and exceptional ease of use. This versatile, large-sample AFM ensures that ...

Invented in 1986 atomic force microscopy (AFM) has become a valuable tool for life scientists, offering the ability to image aqueous biological samples, like membranes, at nanometer resolution. The ...