Michigan Technological University

Origin AFM Sample Preparation

Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...
Michigan Technological University

Origin AFM Basic Science

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...
AZOM

Semilab’s ProberStation 200—A Large Sample AFM System

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
AZOM

Tapping AFM-IR Provides High-Resolution Chemical Imaging

Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...
Business Insider

Park Systems Introduces Park NX-TSH a High Resolution, Automated Tip Scanning Head (TSH) for Industrial Large Sample AFM at Semicon China and Semicon West

SANTA CLARA, Calif., June 23, 2020 /PRNewswire-PRWeb/ -- Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large ...
The Scientist

Atomic Force Microscopy to See the Invisible

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...
EDN

Asylum Research launches small-sample AFM/SPM

Cypher is Asylum Research’s high-resolution, small-sample AFM/SPM (atomic force/scanning probe microscope), a system that provides more capability, increased control, and additional modularity to ...
AZoNano

REFV AFM-IR: Precision in Nanoscale Chemical and Mechanical Analysis

Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...
AZoNano

Market Report: Atomic Force Microscopy (AFM) in Nanoscience

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...
News Medical

AFM in living cell experiments

Novel developments also focus on quick and high-speed AFM to improve temporal resolution. 2 The combination of AFM with optical microscopy has expanded the number of possible applications, ...
PR Newswire

Park Systems Expands FX Large Sample AFM Lineup to Power Next-Gen Industrial Innovation

SEOUL, South Korea, Feb. 19, 2025 /PRNewswire/ -- Park Systems, a global leader in atomic force microscopy (AFM), has unveiled an expanded FX Large Sample AFM series at SEMICON Korea 2025. Building on ...