A new technical paper, “Characterizing tip-sample interaction dynamics on extreme ultraviolet nanostructures using atomic ...

Atomic force microscopy (AFM) is a versatile microscopic technology used for analyzing various samples at the nanoscale dimension. This analytical tool not only offers a three-dimensional image of the ...

In this article, 3D polymeric atomic force microscopy (AFM) tips, referred to as 3DTIPs, are introduced. The key differences between standard silicon AFM tips and the new 3DTIPs design will be covered ...

Carbon nanotube atomic force microscopy probes represent a significant advancement in nanoscale imaging and surface characterisation. Owing to the exceptional mechanical strength, high aspect ratio ...

Competition is heating up in the atomic force microscopy (AFM) market, where several vendors are shipping new AFM systems that address various metrology challenges in packaging, semiconductors and ...