Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

Learn how multi-scale insights from AFM and AFP enhance hybrid bond integrity and device performance.

“Materials scientists designing a polymer-based material for a specific application must analyze how and why all these factors come together to impact the final product. Understanding the structure ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

Researchers have proposed a new method to form an electron lens that will help reduce installation costs for electron microscopes with atomic resolution, proliferating their use. Instead of the ...

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Microscope images could be obtained much more quickly -- rather than one pixel at a time -- thanks to a new imaging method for neutral atomic beam microscopes. It could ultimately lead to engineers ...

Since the first transmission electron microscope was sold in 1935, microscopes that use electrons--rather than light waves--to image objects have brought into focus levels of detail that were ...