To achieve higher quality on multimillion gate designs and high-speed ASICs, manufacturers are relying on structured DFT (design-for-test) methodologies such as scan, at-speed test, scan compression, ...
Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...
Die size and power estimations are at the foundation of SoC implementation. The key is how early and how accurately can it be done. These two parameters are the main data point for making some ...
For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...
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