It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ...
Synopsys Inc. today announced it has upgraded its design-for-test (DFT) and automatic test pattern generation (ATPG) products for system-on-a-chip (SOC) design flow. The upgrades to the company’s ...
Through generations of technology advances, I’ve seen that as a particular task gets more important and usually more complex, it becomes the target of automation and so becomes greatly simplified.
With any new SoC project, there are more things to go wrong than ever imagined during the optimistic early phase of defining the product, writes Ron Press, of Mentor, a Siemens Business. However, the ...
With regards to the ongoing trend of diminishing transistor geometries, we are witnessing a sharp increase in defect density along with significant on-chip process variations that affect transistor ...
Hierarchical DFT methodology and automotive functional safety have been two recent areas of focus for Mentor, a Siemens business. Legacy design-for-test flows impose inefficiencies when transitioning ...
Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
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