What is Electrostatic Force Microscopy? Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a ...

Kelvin probe force microscopy (abbreviated as KPFM, KFM or SKFM) is a technique predicated on atomic force microscopy (AFM): used to examine the electronic properties of nanoscale materials and ...

From materials science to biological research, scientists have embraced Kelvin Probe Force Microscopy (KPFM) for measuring the likes of surface potential and work functions. KPFM reproduces the ...

Researchers from the National Institute of Standards and Technology (NIST), Gaithersburg, MD, working with colleagues from the National Aeronautics and Space Administration, the National Institute of ...

Kelvin probe force microscopy (KPFM) is a key electrical mode used in scanning probe microscopy. It measures a fundamental physical property of materials – a surface potential. Compared to other modes ...