Kelvin probe force microscopy (abbreviated as KPFM, KFM or SKFM) is a technique predicated on atomic force microscopy (AFM): used to examine the electronic properties of nanoscale materials and ...

From materials science to biological research, scientists have embraced Kelvin Probe Force Microscopy (KPFM) for measuring the likes of surface potential and work functions. KPFM reproduces the ...

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...

A team of researchers from the Korea Research Institute of Standards and Science (KRISS) has created a hybrid nano-microscope that can measure a variety of nano-material properties simultaneously.

New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...