Combining an ultra-high-resolution field-emission scanning electron microscope (SEM) column with FEI's Sidewinder focused ion beam (FIB) column and gas chemistries, the Helios NanoLab achieves new ...
A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...
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FIB-SEM enables precise, automated TEM lamella prep with expert insights from Zeiss and the Polish Academy of Sciences.
Enhanced FIB-SEM images of untreated cells and cells treated with Torin, which causes nutrient stress. The ER exit sites (magenta), ER (blue), and all lysosome-related organelles (cyan) are identified ...
3D rendering of FIB-SEM serial-sectioning of a scale iridophore showing an array of thin intracellular crystals arranged in parallel (highlighted by pseudocoloring in blue and gray; the cell’s nucleus ...
Solid oxide electrolysis cells (SOEC) show great promise as an alternative to batteries for storing excess renewable energy as they achieve almost 100% electrical-to-H 2 efficiency. In the SOEC, ...
When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
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