A research team led by Prof. LU Qingyou from Hefei Institutes of Physical Science (HFIPS) of the Chinese Academy of Sciences (CAS) achieved a major breakthrough by creating a Magnetic Force Microscope ...

MELVILLE, N.Y., November 3, 2023 – An examination of the impact of image size on measurements from magnetic force microscopy has won the Advances in Magnetism Award, sponsored by AIP Advances, ...

Analyzing magnetic nanostructures with a high resolution is a test-and-measurement challenge, but it’s important for both advanced physics insight as well as real-world products such as high-density ...

The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

A major advantage of atomic force microscopes (AFMs) is their versatility in integrating various operational modes that assess different material properties and functionalities. Among the most ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...