Orientation Imaging Microscopy (OIM) is a technique based on the automated collection and analysis of Electron Backscatter Diffraction (EBSD) patterns. It is a powerful characterization and analysis ...
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The critical pre-authentication RCE flaw is added to CISA’s KEV catalog, with a warning for federal civilian agencies to apply Oracle’s October patch by December 12. The Cybersecurity and ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure EDAX OIM Analysis ™ is a powerful tool ...
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