Spatial resolution of less than 10 nm has been identified as a requirement for accurate and quantitative two-dimensional dopant profiling by the International Technology Roadmap for Semiconductors ...
A National Institute of Standards and Technology (NIST) researcher and a Korean guest researcher describe a new method for scanning semiconductors for defects that may help accelerate the market for ...
(Nanowerk News) Semiconductors are foundational components of modern energy, communication, and myriad other technologies. Research on tailoring the underlying nanostructure of semiconductors for ...
Complex interrelated phenomena lead to battery failure, which is dependent on battery design, environment, chemistry, and true operation conditions. Therefore, studies at the component level are ...
In recent decades, there has been an increased desire to miniaturize electronics, which, in turn, has enhanced the demand for nano-electrical characterization methods. It is crucial that an ...
LONDON--(BUSINESS WIRE)--According to the latest market study released by Technavio, the global scanning electron microscope (SEM) market is expected to grow at a CAGR of close to 8% during the ...
AFM-based nanoelectrical modes are used in many different domains ranging from piezoelectric materials and semiconductors through to biology and energy research. There are modes available to define ...
Agilent Technologies Inc. has announced the availability of scanning microwave microscopy (SMM) mode, an imaging technique that combines the comprehensive electrical measurement capabilities of a ...
Designers of semiconductor devices are like downhill skiers---they thrive on speed. And achieving speed in the semiconductor business is all about the stuff you start with. While silicon is still the ...
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