A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

All matter is made of very small units called atoms. Atoms are so small they cannot be seen using a regular microscope. Scientists have discovered a way to “see” atoms using a special instrument ...

Scanning Capacitance Microscopy (SCM) and Scanning Spreading Resistance Microscopy (SSRM) are both well-established scanning probe-based techniques for two-dimensional carrier profiling. Driven by the ...

Lithium ion batteries dominate the energy storage sector from the scale of small portable devices to electric vehicles and even grid-scale electricity suppliers. Research is constantly ongoing to ...

A new technical paper titled “Gradient Electronic Landscapes in van der Waals Heterostructures” was published by researchers ...