Electronic Design

Simplify SoC Development With Embedded Testing

While the use of complex system-on-a-chip (SoC) designs has increased, unfortunately, that hasn't increased the time-to-market window for designers and chip manufacturers. As SoC designs become more ...
EDN

Optimizing the SOC test-development effort

Every business, product, or process can benefit from an ROI (return-on-investment) analysis that enables management to determine how much to invest, how many resources to allocate and, ultimately, ...
EDN

SoC test requirements debated

BALTIMORE — The prevalence and escalating cost of system-on-chip (SoC) designs are forcing a reexamination of existing approaches to design and test, according to EDA and test industry executives at a ...
Electronic Design

DFT Propels SoC IC Testing

The Design-for-Test (DFT) methodology is a strong driving force in the cost-effective testing of large-volume commodity items with very short life cycles, like system-on-chip (SoC) devices. It will ...
Semiconductor Engineering

Wafer-Level Test Infrastructure for Higher Parallel Wafer Level Testing of SoC

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Digi Times

Lead times for high-end SoC testers extend to over 6 months, says Advantest

It will take at least six months for Advantest to deliver its high-end SoC testing equipment as shortage of key chip components needed to power the equipment has constrained the company's production, ...
Semiconductor Engineering

Supporting Multiple Time Domains In SoC Production Test

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...