Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

In the decade since their discovery at Drexel University, the family of two-dimensional materials called MXenes has shown a great deal of promise for applications ranging from water desalination and ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

Understanding how voltage drives nanoscale electrocatalysts to initiate reactions is a fundamental scientific question. This is especially challenging when dealing with non-metallic electrocatalysts ...

Kelvin Probe Force Microscopy (KPFM) has emerged as a critical technique for the nanoscale investigation of electrical properties, enabling detailed mapping of surface potential and contact potential ...

Using scanning tunneling microscopy, researchers at Drexel University and UCLA are providing the first atom-scale look at the surface of 2D MXene materials. The findings will help to tailor the unique ...

In the decade since their discovery, the family of two-dimensional materials called MXenes has shown a great deal of promise for applications ranging from water desalination and energy storage to ...